Measurement Principle

Energy Dispersion Fluorescence X-ray Analysis Method

Elements Measured

Si to U(Cd/Pb high-sensitivity model)
Na to U(option: when selecting the 1.2 mm/0.1 mm diameter switching method)

Lower Detection Limit(Cd/Pb)

Sample Shape

Maximum Size: 460 X 360 mm(height: 150 mm)

Sample Chamber Atmosphere

Normal Atmospheric Pressure

X-ray Tube

Target

Rh

Tube Voltage

50 kV max.

Tube Current

1 mA max.

X-ray Radiation Diameter

1.2 mm
(option: 1.2 mm/0.1 mm switchable)

Detector

XEROPHY High-Purity Si Detector

Dewar Capacity

3 Liters

Liquid Nitrogen Consumption

1 liter or less per day
(no replenishment needed during storage)

Optical Image Observation

approx. 50X magnification
(coaxial observation from the X-ray axis)

Software

Qualitative Analysis: automatic or Manual Qualitative Analysis

Qualitative Analysis: Analytical Curve Method
(When Using 0.1 mm lrradiation Diameter: Fundamental Parameter Methods 1. Standardless, 2. 1-Point Calibration)

User-Settable Functions: A sequence of operations from measurement to quantitative analysis can be performed in accordance with preset conditions entered by the user.

Computer

CPU

Pentium IV 1.8 GHz or faster

Memory

256 MB or more

Hard disk

20 GB or larger

OS

Windows XP

Display

17 in. CRT monitor(option: 17 in. LCD monitor)

Printer

color Inkjet Ptinter

Ambient Temperature

10°C to 35°C(optimum performance temperature)
5°C to 40°C(operating temperature)

Ambient Humidity

Humidity Range from 5°C to 31°C: 80% maximum relative humidity
Humidity Range from 31°C to 40°C: linear decrease to 50% relative humidity

Electric Power Supply

AC 100 V, 120 V, 220 V, 240 V ±10%, 50/60 Hz

Electric Power Consumption

1.3 kVA or less(including computer, CRT and printer)

System Weight

approx. 265 kg(including stand and computer)

External Dimensions

Analyzing Unit

610(W) X 750(D) X 500(H) mm

Sugnal Processing Unit

220(W) X 500(D) X 480(H) mm