

In the manufacturing process of LCD panels, which are essential to cell phones, this analyzer rapidly measures, with high precision, the thickness and optical constants of a variety of thin films and multilayer films on glass substrates. It is also compatible with low-temperature polysilicon, amorphous silicon liquid crystal and next-generation organic electroluminescent (EL) displays.
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Compliance with the EU RoHS Directive related to restrictions on hazardous materials contained in electronic devices is a major issue for the manufacturing sector. Capable of measuring five of the restricted substances in just 30 seconds, this analyzer greatly contributes to the management of substances and materials used in electronic equipment.
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The reason the size of handsets is shrinking even though functions are increasing is due to ongoing progress in higher density integration on substrates. The frontlines of industry are pursuing the ultimate limits of microelectronics, and devices are necessary to accurately measure the thickness of ultra-thin films. This analyzer is the result of a fusion of HORIBA JOBIN YVON's spectroscopic ellipsometer technology and HORIBA's manufacturing technology.
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