Photovoltaic Product List
Categories
Impurity Control
Material Analysis
DI Water Analysis
Thin Film Control/Analysis
Drain Water Analysis
Chemical Analysis
Gas Control/Analysis/Process Monitoring
Semiconductor Product List
FPD Product List
Impurity Control
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Oxygen/Nitrogen Analyzer
EMGA-620
Particle Size Distribution Analyzer
LA-950V2
Hydrogen Analyzer
EMGA-621W
ICP Emission Spectrometer
ULTIMA 2
Carbon/Sulfur Analyzer
EMIA-920V
Material Analysis
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PL Measuring Equipment
Photoluminor
X-ray Analytical Microscope
XGT-5000 Series
Energy Dispersive X-ray Analyzer
EMAX ENERGY
Raman Spectroscopy System
LabRAM ARAMIS
Glow Discharge Optical Emission Spectroscopy
GD-Profiler 2
DI Water Analysis
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Silica Monitor
SLIA-300
For Ultra-pure Water Resistivity Meter
HE-960RW
Silica Analyzer
SLIA-2000
Dissolved Oxygen Monitor
SD-300
Thin Film Control/Analysis
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Real Time Interferometric Film Thickness Monitor
LEM-CT670
Spectroscopic Ellipsometer
UVISEL
Full Automatic Film Analyzer
FF-1000
Real Time Interferometric Film Thickness Monitor
DIGILEM-CPM-Xe/Halogen
Visible Spectroscopic Ellipsometer
MM-16
Full Automatic Spectroscopic Ellipsometer
UT-300
Plasma Diagnosis Endpoint Monitor
DigiCPM_J
Full Automatic Raman Analyzer
FR-3000
Drain Water Analysis
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Fluoride Ion Monitor
FLIA-101
Total Nitrogen/Total Phosphorus Measurement System
TPNA-300
Free Fluoride Ion Monitor
IF-250
Chemical Analysis
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Fiber Optic Type Chemical Solution Concentration Monitor
CS-100F1 Series
IPA GAS Concentration Monitor
IR-150AS
Resistivity Meter
HE-480R
Chemical Solution Concentration Monitor
CS-100 Series
Low Concentration HF/HCl/NH3 Monitor
HF-960M
Conductivity Meter
HE-480 Series
Hydrofluoric Acid Monitor
CM-200/210
Dissolved Ozone Monitor
HZ-960
Liquid Mass Flow Meter/Controller
LF-F/LV-F Series
Gas Control/Analysis/Process Monitoring
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Digital Mass Flow Controller
SEC-Z500X Series
Mass Flow Controller
SEC-E40 Series
Automatic Pressure Regulator
UR-7340/7350 Series
Vaporized Liquid Source Control System
LSC-A100 Series
Liquid Source Auto Recharge System
LU-A1000 Series
Residual Gas Analyzer
MICROPOLE™ System
FTIR Gas Analyzer
FG-100A Series
News
Introducing New Particle Size Analyzer (LA-950V2)
2007/08/22
HORIBA, Ltd. Announces the Grand Opening of the “HORIBA Technology Center” in Santa Clara, California.
2007/07/05
HORIBA Ltd. is ready for when the China RoHS is introduced this coming spring with our multiple model lineup with microanalysis capability and higher sensitivity
2007/02/27
Second Chinese Plant Completed in Shanghai to Step up Production in China
2006/09/27
The 2006 Masao Horiba Awards: Announcement of Prizewinners/Awards Ceremony to Be Held on October 17
2006/08/22
Information on Relevant Technologies
HORIBA Group Technology Matrix
Technical Consultation
Technical consultations on the semiconductor related products of HORIBA are being accepted.
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