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 HOME >> Products & Support >> Semiconductor Manufacturing Process Monitor DIGI Series
Semiconductor Instruments & SystemsProducts
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General
Real Time Interferometric Process Monitor
Plasma Diagnosis Endpoint Monitor
Example of measurement

Semiconductor Manufacturing Process Monitor

DIGI Series

Examples of measurement

• DIGILEM-CPM-Xe
Al2O3/Altic etching
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• LEM-CT
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• LEM-CT-670-G50
Nb/Au interface detection
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• DigiCPM_J
AC POLYSTRIP
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• DigiCPM_J
Dual damascene
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Step 1:
Descum
Step 2:
SiO2 etch
(C4F8, C2F6, Ar, 60 s) :
step 2 is monitored
Step 3 to 6: Strip (O2...)
Step 7:
Nitride etch
(CHF3, O2, Ar, 38 s) :
step 7 is monitored

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