Japan Worldwide
News & EventsInvestorsProcurementCompany HomeContactsSite MapJapanese
Products & Support Automotive Process & Environmental Medical-Diagnostics Semiconductor Scientific Applications
Measurement Types
Product List
 HOME >> Products & Support >> IPA Gas Concentration Monitor IR-150AS
Semiconductor Instruments & SystemsProducts
product image
IR-150AS
Specifications, External dimensions, Connection diagram
Related products

IPA Gas Concentration Monitor

IR-150AS

Outline

IPA (IsoPropyl Alcohol) is widely used in the drying processes required for effective wet cleaning during semiconductor manufacturing. In the past few years, as wafer sizes and circuit miniaturization have increased, more and more attention has been focused on improving productivity through the proper monitoring and control of IPA gas concentration during different IPA drying processes, while using a range of cleaning and CMP equipment. HORIBA has used its gas analysis technology and its cleaning process experience - which has been honed through the development and production of chemical solution concentration monitors such as the SC-1 and SC-2, mass flow controllers, and a variety of fluid supply systems - to develop a new IPA gas concentration monitor. This IPA gas concentration monitor completes HORIBA's wet cleaning process density control lineup, and makes it possible for the company to offer total wet cleaning process solutions that meet all its customers needs.


Main Features

  • Mounts inline for real-time measurement.
  • Features a compact, space-saving design.
  • Perfect for monitoring IPA concentration in all kinds of cleaning equipment during drying processes.


Sample installation

The IPA gas concentration monitor can be combined with a mass flow controller or vaporizer, and is perfect for use in combination with a vaporizer or bubbler as a secondary gas concentration monitor.
Image


TOP
Copyright (C) 2008 HORIBA, Ltd. All rights reserved.

Copyright © 2008 HORIBA, Ltd. All rights reserved. The information shown on this document may be modified without notice. Refer to the original web page for update. The page was copied from:
 
Explore the future HORIBA