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 HOME >> Products & Support >> Semiconductor >> Reticle/Mask Particle Detection System PR-PD2HR
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PR-PD2HR
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Measurement Principle
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Utility (setup configuration example)
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Reticle/Mask Particle Detection System

PR-PD2HR

Specifications

Principle
Polarized laser scattering method
Inspection object
Reticle/mask with or without pellicle
Detector
Photomultiplier
Light source
Argon laser 488 nm, 10 mW
Reticle/mask size
5" x 5", 6" x 6", 2.3 to 6.3 mm thickness (maximum 1/4")
Option: 3" x 5", 7" x 7", Ø7-1/4 with holder, 230 mm
Pellicle
Thickness: 0.865 to 2.85 µm (±0.2 µm)
Frame height:
  Glass surface (upper): 2.5 to 4.0 mm
  Pattern surface (lower): 2.5 to 6.3 mm
Frame size: Differs depend on reticle case.
Detectable particle size
Pattern surface: 0.35 µm or lager
Glass surface: 5 µm or lager
Pellicle surface: 10 µm or lager
(PSL equivalent diameter)
Detectability
Standard mode: More than 90% of 0.35 µm particles.
5-inspection integrated mode: More than 93% of 0.35 µm particles.
Particle level setting
Pattern surface: 0.25 to 10 (3 steps)
Glass surface: 1.5 to 30.0 (3 steps)
Pellicle surface: 4 to 99 (3 steps)
Inspection area
Shape: Square, rectangle, circle
Area:
  5" x 5": 10 x 10 to 105 x 110 mm or
  Ø10 to Ø105 mm
  6" x 6": 10 x 10 to 127 x 139 mm or
  Ø10 to Ø127 mm
  7" x 7": 10 x 10 to 160 x 160 mm or
  Ø10 to Ø160 mm (Option)
Actual inspection area differs with reticle support stage and pellicle size. (7", 230 mm Option)
Inspection result
LCD display:
Map: Results for the entire inspection area, and results of magnifying the main map with X-Y coordinates for particle positions.
Particle observation
LCD screen observed from top and bottom side.
Magnification: 220 x, 440 x, 1100 x (bottom side) 440 x fixed (top side)
Illumination: Bright/dark-field illumination, combined with top light.
Standard function
Automatic review (skip) function, Coordinate origin setting/rotation compensation function, Inspection center function, Map display insert/delete function, Bar code ready (Hard ware option)
Optional functions
Pellicle only inspection, Mask blank inspection, Inspection of additional substrate size, 2 way data communication (GEM or SECS2)
Dimensions
1710 (W) x 1540 (H) x 1400* (D) mm
67.3 (W) x 60.6 (H) x 55.1* (D) in.
*Maximum width including a status lamp and a duct.
Weight
Approx. 1000kg/2222 lbs

UTILITIES
Installation site
Clean bench: Class 10 or better
Temperature: 23±1°C
Power
200/210/220/240 V AC ±10 V (Customer specified), single phase 4k VA, 50/60 Hz
Vacuum source
Pressure difference: 8.0 x 104 Pa or more 50 L/min.

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