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UT-300
Specifications
Phase modulation by PEM element
Typical system configurations
Operation / result display example

Full Automatic Ultra Thin Film Analyzer
UT-300

Operation / result display example

Job Setup
Various measurement recipes can be set by the engineer for each wafer port (four shown here) .
Job Setup

Cassette Trend Graph
The graph shows 25 wafers per lot horizontally and their thickness vertically. The film thickness control values can be set in two steps with blue and red lines. Measurements are shown in red if the control value is exceeded and in green if it is met.
Cassette Trend Graph

Current Wafer Map View
Results at the measuring point are displayed in color.
Red: Thickness control value is exceeded
Green: Thickness control value is met
Current Wafer Map View

Measuring Status
The wafer measuring process is diaplayed in real time on the visual screen.
Measuring Status


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Copyright (C) 2008 HORIBA, Ltd. All rights reserved.

Copyright © 2008 HORIBA, Ltd. All rights reserved. The information shown on this document may be modified without notice. Refer to the original web page for update. The page was copied from:
 
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