MESA analyzes a large objects using a ø 5 mm x-ray issued from a distant place. Our XGT collects and focuses this x-ray into a glass tube, known as an x-ray guide tube, and amplifies the ray to ø 10 µm / Éｳ100µm to analyze an object with several to tens of hundredsµm in size. When an optional stage is used, the XGT can make an x-ray penetration image with a chip sample of up to 20 cm, while simultaneously perform element mapping. This breakthrough technology was jointly developed by the National Institute for Research in Inorganic Materials of the Science and Technology Agency and the Research Development Corporation of Japan.