No.E02 p.1-2 Foreword The Challenge of Global Business Andrew MACKINTOSH No.E02 p.3-9 Discussion Round Table Talk on Metrology in the Twenty-first Century and Technolgy Tie-ups Hidehito OBAYASHI/Kozo ISHIDA/Koichi MATUMOTO No.E02 p.10-13 Article Technology and Product Development of HORIBA's Laboratory Analytical Instrument for R&D and Quality Control ¡½ Focusing on X-ray analytical instruments Kenichi OBORI No.E02 p.14-18 Article SEM/EDX ¡½ Integrated Analysis system SEMEDX Series Toshikazu YURUGI/Sukehiro ITO/Yohinori NUMATA/Keith SYKES No.E02 p.19-24 Article Versatile Multi-Element Analysis Using X-ray Fluorescence The MESA-500 Series and The MDX-1000 series Akimichi KIRA/Neal ROBSON No.E02 p.25-29 Article The HORIBA Application Center Provides Solutions : The X-Ray Analytical Microscope Katumi NAGASAWA/Akihiro HIRANO/Sumiyo ISHIKAWA * Inquiries to HORIBA Technical Reports; Readout * The user registration system has been discontinued and a new system has been adopted starting April 1st, 2006. Users may now download PDF files without having to register for passwords with the new system. Regarding personal information of customers who had registered as users prior to March 31st, 2006, we have deleted all personal information in a secure environment under strict supervision in order to ensure no leaks of information to third parties. * All texts and illustrations of this home page are protected by copyright. * The readout files are in Adobe Acrobat format.To view them you will need to download the Acrobat Reader.

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